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Low-Temperature-Scanning-Laser Microscope

Brief description of equipment

Microscope for the investigation of electric and optical properties of thin film structures in combination with electric transport measurements at temperatures from ~4 K to 300 K.


Contact person(s)
Dieter Kölle

University of Tübingen
Institute of Physics
Experimental Physics II

Related publications

B. Gross et al., Electrothermal behavior and terahertz emission properties of a planar array of two Bi2Sr2CaCu2O8-δ intrinsic Josephson junction stacks, Supercond. Sci. Technol. 28, 055004 (2015).

B. Gross et al., Hot-spot formation in stacks of intrinsic Josephson junctions in Bi2Sr2CaCu2O8, Phys. Rev. B 86, 094524 (2012).

H. B. Wang et al., Coherent Terahertz Emission of Intrinsic Josephson Junction Stacks in the Hot Spot Regime, Phys. Rev. Lett. 105, 057002 (2010).


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