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Focused Ion Beam (FIB)

Brief description of equipment

Dual Beam FIB “FEI Strata DB235” (Ga ion and electron beam), including two Kleindiek micromanipulators and gas injection system with precursor for Pt focused ion/electron beam induced deposition (FIBID/FEBID).



Contact person(s)
Markus Turad, Ronny Löffler

University of Tübingen
Center for Light-Matter Interaction, Sensors & Analytics (LISA+)

Related publications

M. J. Martínez-Pérez et al., NanoSQUID magnetometry of individual cobalt nanoparticles grown by focused electron beam induced deposition, Supercond. Sci. Technol. 30, 024003 (2017).

T. Schwarz et al., Low-noise YBa2Cu3O7 Nano-SQUIDs for Performing Magnetization-Reversal Measurements on Magnetic Nanoparticles, Phys. Rev. Appl. 3, 044011 (2015).

J. Li et al., Local destruction of superconductivity by non-magnetic impurities in mesoscopic iron-based superconductors, Nature Commun. 6, 7614 (2015)

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