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In situ electromigration

Brief description of equipment

In situ visualization of electromigration process in a scanning electron microscopy chamber



Contact person(s)

Alejandro Silhanek

Université de Liège

Related publications

In situ tailoring of superconducting junctions via electro-annealing
J. Lombardo, Ž. L. Jelić, X. D. A. Baumans, J. E. Scheerder, J. P. Nacenta, V. V. Moshchalkov, J. Van de Vondel, R. B. G. Kramer, M. V. Milosevic and A. V. Silhanek.
Nanoscale 10, 1987 (2018).

Healing Effect of Controlled Anti-Electromigration on Conventional and High-Tc Superconducting Nanowires
X. D. A. Baumans, J. Lombardo, J. Brisbois, G. Shaw, V. S. Zharinov, G. He, H. Yu, J. Yuan, B. Zhu, K. Jin, R. B. G. Kramer, J. Van de Vondel and A. V. Silhanek.
Small 13, 1700384 (2017).

Thermal and quantum depletion of superconductivity in narrow junctions created by controlled electromigration
X. D. A. Baumans, D. Cerbu, O.-A. Adami, V. S. Zharinov, N. Verellen, G. Papari, J. E. Scheerder, G. Zhang, V. V. Moshchalkov, A. V. Silhanek and J. Van de Vondel.
Nat. Commun. 7, 10560 (2016).


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