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X-Ray Diffractometer (XRD)

Brief description of equipment

Four-circle high-resolution XRD with different optics for investigation of thin films, single crystals and powders.



Contact person(s)

Markus Turad, Ronny Löffler

University of Tübingen
Center for Light-Matter Interaction, Sensors & Analytics (LISA+)

Related publications

J. Tomaschko et al., Properties of the electron-doped infinite-layer superconductor Sr1-xLaxCuO2 epitaxially grown by pulsed laser deposition, Phys. Rev. B 85, 024519 (2012).


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