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Low-Temperature-Scanning-Electron Microsope

Brief description of equipment

Commercial SEM (thermal emitter) with home-made He-cooled sample stage for the investigation of spatially resolved electric transport properties of thin film devices from ~4 K to 300 K.

Contact person(s)
Dieter Kölle

University of Tübingen
Institute of Physics
Experimental Physics II

Related publications

H. J. Harsan Ma et al., Local electric imaging of tetragonal domains and field-induced ferroelectric twin walls in conducting SrTiO3, Phys. Rev. Lett. 116, 257601 (2016).

S. Guénon et al., Electric breakdown in a V2O3 device at the insulator-to-metal transition, Europhys. Lett. 101, 57003 (2013).

J. Tomaschko et al., Phase-sensitive evidence for dx2-y2-pairing symmetry in the parent-structure high-Tc cuprate superconductor Sr1-xLaxCuO2, Phys. Rev. B 86, 094509 (2012


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